Instrumentation
Five High Resolution Wavelength Spectrometers
Ultra-Sensitive Light Element Detectors
Backscattered Electron (BSE) and Secondary Electron (SE) imaging detectors
Capabilities
Be to U wavelength analysis
20 to 400ppm detectability level
Quantitative Elemental Analysis
2 ev to 25 ev RWHM resolution
Elemental X-ray mapping
Expertise
Fuel Cell analysis
Weld Analysis
Carbon diffusion analysis in engine cylinders
Low carbon steel analysis
Semiconductor imaging and mapping

