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Electron Microprobe Analysis

Instrumentation

Five High Resolution Wavelength Spectrometers electron_microprobe
Ultra-Sensitive Light Element Detectors
Backscattered Electron (BSE) and Secondary Electron (SE) imaging detectors

Capabilities

Be to U wavelength analysis
20 to 400ppm detectability level
Quantitative Elemental Analysis
2 ev to 25 ev RWHM resolution
Elemental X-ray mapping

Expertise

Fuel Cell analysis
Weld Analysis
Carbon diffusion analysis in engine cylinders
Low carbon steel analysis
Semiconductor imaging and mapping